X-ray diffractometer

X-ray diffractometer D8 Advance and D5005

X-ray diffractometer D8 Advance
© Fraunhofer IWS Dresden
X-ray diffractometer D8 Advance
Measuring arrangement with two parallel beam optics, one behind the source and one in front of the optical detector
© Fraunhofer IWS Dresden
Measuring arrangement with two parallel beam optics, one behind the source and one in front of the optical detector

Producer

  • D8 Advance - Bruker AXS GmbH
  • D5005 - Siemens


Technical data

  • X-ray tube (Cu, Mo, Co, ...) with 0.04 x 12 mm2 long-fine focus or 0.4 x 0.4 mm2 point focus
  • sample holder: fixed, Ø = 150 mm
  • scintillation detector
  • beam divergence: Δθ < 0.02 °
  • use of Ni/C - Goebel mirror for:
    - monochromization and suppression of fluorescence radiation
    - suppression of Cu-Kß radiation
    - simple adjustment and short measuring times for parallel beam geometry


Application

  • X-ray reflectometry at thin layer systems to determine thickness, roughness and density
  • X-ray diffractometry at powders and polycrystalline layers to analyze phases with respect to quantity and quality
  • development of new optical systems