Magnetron Sputter Deposition (MSD)

MSD process for the coating of Mo/Si multilayers
© Fraunhofer IWS Dresden
MSD process for the coating of Mo/Si multilayers
UHV clustertool for generating precision nanometer multilayer systems
© Fraunhofer IWS
UHV clustertool for generating precision nanometer multilayer systems
Schematic diagram of the target-substrate arrangement
© Fraunhofer IWS
Schematic diagram of the target-substrate arrangement

Layer fabrication

  • plasma generation by impact ionization
  • static magnetic field to increase the plasma density
  • sputtering of the target by impact processes between sputter gas ions and target atoms
  • condensation of the sputtered particles on the substrate surface


Process conditions

  • vacuum: p ~ 2 x 10-8 mbar
  • Ar sputter gas pressure: p > 7 x 10-4 mbar
  • magnetron operation: DC, RF for reactive processes
  • number of sputtering sources: 4
  • discharge power: > 1 kW
  • target size: 304,8 mm x 88,9 mm (12'' x 3,5'')
  • substrate size: load-lock up to a diameter of 200 mm, larger substrates of up to 500 mm have to be operated by hand through the chamber door
  • target-substrate distance: 50 ... 100 mm


Advantages of the MSD procedure

  • high coating rates
  • very stable, simple and reproducible process operation
  • excellent film homogeneity
  • simple scalability to larger geometries


Applications

  • EUV reflection layer (Mo/Si)
  • X-ray optical multilayer systems (W/Si, W/B4C, Mo/B4C, ...)
  • XUV reflection layers (Cr/Sc, Sc/Si, Mo/Si, ...)
  • monochromators for X-ray fluorescence analysis (W/Si, W/B4C, Mo/Si, Mo/B4C, Cr/Sc, Cr/C, ...)
  • metallic coatings for reflections (Al, Ag, ...)
  • dielectic multilayer systems (SiO2/Al2O3, SiO2/TiO2, ...)
  • layer thickness standards (Ru, Cu, Al, Ti, Cr, Si, C, B4C, Sc, Ag, ...)