Analytical transmission electron microscope

Producer / type

• JEM-2100Plus (Fa. JEOL)
   

Equipment / technical data

• Acceleration voltage: 200 kV
• 4 level condenser system for flexible beam control
• High resolution analytical pole shoe: dot resolution = 0,23 nm, line resolution = 0,14 nm, specimen tilt: ± 30°
• Modern multi scan camera systems:
  - Wide angle camera for fast live image, overview and diffraction image
  - High resolution camera with an outstanding image quality
• Scanning transmission electron microscopy mode (STEM)
• EDS micro-analysis with drift correction (JED2300T) by Oxford Instruments

Methods

• Conventional transmission electron microscopy
• High resolution transmission electron microscopy (HRTEM)
• Electron diffraction: Selected Area Diffraction (SAD), Nano Beam Diffraction (NBD)
• Scanning transmission electron microscopy (STEM): bright field and angle annular dark field imaging (HAADF)
• Local element analysis with EDX (< 10nm), Spot analysis, Line scan, Mapping, Sequential analysis
• Analysis of the materials inner structure: lattice defects, grain boundaries, segregations