Fraunhofer Institute for Material and Beam Technology IWS
Analytical TEM JEM-2100
Slip band arrangement in laser shock treated Mo – TEM bright field image
Producer / type
- JEM-2100Plus (Fa. JEOL)
Equipment / technical data
- Acceleration voltage: 200 kV
- 4 level condenser system for flexible beam control
- High resolution analytical pole shoe: dot resolution = 0,23 nm, line resolution = 0,14 nm, specimen tilt: ± 30°
- Modern multi scan camera systems:
- Wide angle camera for fast live image, overview and diffraction image
- High resolution camera with an outstanding image quality - Scanning transmission electron microscopy mode (STEM)
- EDS micro-analysis with drift correction (JED2300T) by Oxford Instruments
Methods
- Conventional transmission electron microscopy
- High resolution transmission electron microscopy (HRTEM)
- Electron diffraction: Selected Area Diffraction (SAD), Nano Beam Diffraction (NBD)
- Scanning transmission electron microscopy (STEM): bright field and angle annular dark field imaging (HAADF)
- Local element analysis with EDX (< 10nm), Spot analysis, Line scan, Mapping, Sequential analysis
- Analysis of the materials inner structure: lattice defects, grain boundaries, segregations