Analysis of thin film systems with analytical transmission electron microscopy

High resolution image of a reactive multilayer coating stack (RMS)
© Fraunhofer IWS Dresden
High resolution image of a reactive multilayer coating stack (RMS)
Element distribution (TEM line scan) of Ti and Cr in a hard coating
© Fraunhofer IWS Dresden
Element distribution (TEM line scan) of Ti and Cr in a hard coating

- Coating structure, periodicity and growth
- Formation and development of defects
- Crystal structure of the individual layers

  • Analysis of interface properties

- Flatness
- Interdiffusion zones

  • Strategy development to optimize the coating process