Analytical transmission electron microscope

Analytical TEM JEM-2100
© Frank Höhler

Analytical TEM JEM-2100

Star shaped sliding path arrangement in laser shock treated molybdenum – TEM bright field image
© Fraunhofer IWS Dresden

Star shaped sliding path arrangement in laser shock treated molybdenum – TEM bright field image

Producer / type

  • JEM-2100; company JEOL

Equipment / technical data

  • 200 kV accelerating voltage
  • 4 level condenser system for flexible beam control
  • high resolution analytical pole shoe: resolution: 0.14 nm; sample tilt +/- 30 °
  • modern multi scan camera systems
  • wide angle camera for fast live image, overview and diffraction images
  • high resolution camera with outstanding image quality
  • scanning feature (STEM)
  • EDX analytical system (JED2300T)

Methods

  • conventional transmission electron microscopy
  • high resolution transmission electron microscopy (HRTEM)
  • electron diffraction
  • selected area diffraction (SAD)
  • nano beam diffraction (NBD)
  • scanning transmission electron microscopy (STEM)
  • bright field and high angle annular dark field imaging (HAADF)
  • energy dispersive X-ray spectroscopy (EDX)
  • point analysis, line scan, mapping, sequential analysis, drift correction