Analytical scanning electron microscopes

Analytical SEM JSM 6400
© Fraunhofer IWS Dresden

Analytical SEM JSM 6400

EDX element distribution image of an Al cast alloy
© Fraunhofer IWS Dresden

EDX element distribution image of an Al cast alloy

Producer / type

  • 2 scanning electron microscopes: JSM 6400 and JSM 6300; Company JEOL

Equipment / technical data

  • accelerating voltages up to 40 kV (JSM 6400) or 30 kV (JSM 6300)
  • detectors for secondary electrons and backscattered electrons
  • 5 axes rotating table
  • EDX micro analysis system; Company Thermo

Application areas

Characterization of the morphology of surfaces, structural analysis (grains, phases, 2D and 3D lattice defects), analysis of thin films and surface zones, fractography.