Producer / type
- 2 scanning electron microscopes: JSM 6400 and JSM 6300; Company JEOL
Equipment / technical data
- accelerating voltages up to 40 kV (JSM 6400) or 30 kV (JSM 6300)
- detectors for secondary electrons and backscattered electrons
- 5 axes rotating table
- EDX micro analysis system; Company Thermo
Characterization of the morphology of surfaces, structural analysis (grains, phases, 2D and 3D lattice defects), analysis of thin films and surface zones, fractography.