Preparation techniques for electron microscopy

Ion cross section polisher to prepare sharp edge cross section samples
© Fraunhofer IWS Dresden

Ion cross section polisher to prepare sharp edge cross section samples

Ion beam system PIPS 691 for preparation of TEM specimen
© Fraunhofer IWS Dresden

Ion beam system PIPS 691 for preparation of TEM specimen

Equipment

  • electrolyte jet system “Tenupol”
  • electrolytic polishing and etching system “PoliMat2”
  • ion beam etching system “Cross Section Polisher”
  • ion beam polishing system “PIPS 691”
  • direct access to “focusing ion beam technology” (FIB) within the framework of the Dresden “Fraunhofer Cluster Nanoanalytics”

Applications

  • TEM sample and target preparation of various materials and coating systems
  • preparation of deformation-free and sharp edge cross section samples for SEM and EDX analytics
  • preparation of heterogeneous materials, complicated coating systems, modified surface zones and welding interfaces
  • electrolytic polishing and etching of metallic materials