Optical spectrometer (UV, VIS, NIR, MIR, RAMAN)

FT-NIR spectrometer Vertex 70 with integrating sphere (Bruker Optik)

FT-NIR spectrometer Vertex with integrating sphere (Bruker Optics)
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FT-NIR spectrometer Vertex with integrating sphere (Bruker Optics)

The FTIR spectrometer analyses structures, bonding relations and sample compositions. In contrast to the FTIR spectroscopy in the near infra red area, harmonics and intermodulations are activated. By the help of this device, e.g., plastic materials can be differed or humidity contents in solid states and moistures can be determined.

Requirements

  • sample size: transmission  15 x 15 mm2 to 150 x 150 mm2; diffuse reflection min. 25 x 25 mm2

FT-NIR spectrometer Vertex 70 integrating sphere (Bruker Optik)

  • measuring mode: transmission, diffuse reflection
  • measuring range: 12800 cm-1 - 3500 cm-1 (0,78 µm - 2,85 µm)
  • resolution: starting with 0,5 cm-1
  • accessories: integrating sphere to measure the diffuse reflection

FTIR spectrometer Spectrum 2000 with AutoImage Microscope (Perkin Elmer)

FTIR spectrometer Spectrum 2000 with AutoImage Microscope (Perkin Elmer)
© Fraunhofer IWS Dresden

FTIR spectrometer Spectrum 2000 with AutoImage Microscope (Perkin Elmer)

The FTIR spectrometer analyses structures, bonding relations and sample compositions (ceramics, glasses, plastic materials, semi-conductors) in any combination and any condition (compact solid state, fractured surface, powder, fiber). The device identifies materials, impurities, detects functionalities or determines optical properties (refraction index, extinction coefficient) of films and compact solid states within the ultra-red spectroscopic range.

Service offer

  • FTIR spectroscopic and FTIR microscopic investigations of any customer-tailored samples
  • development of complex measuring and analysing methods for quality control
  • determination of IR optical material functions (dielectric function, refraction index, extinction coefficient) of samples and film systems

Requirements

  • various sample sizes can be investigated
  • sample size is dependent on the measuring mode
  • no aqueous solutions

FTIR spectrometer Spectrum 2000 with Autoimage Microscope (Perkin Elmer)

  • measuring mode: transmission, specular reflection, diffuse reflection, attenuated total reflection (ATR)
  • measuring range: 7800 cm-1 - 400 cm-1 (1,3 µm - 25 µm)
    measurements in FIR up to 100 cm-1 (100 µm)
  • resolution: starting with 0,5 cm-1
  • accessories for specular reflection incidence angle 10° - 80°, diffuse reflection, ATR crystals ZnSe, Ge, diamond (golden gate)

Microscope

  • measuring mode: transmission, specular reflection, attenuated total reflexion (ATR)
  • measuring range: 7800 cm-1 - 600 cm-1 (1,3 µm - 17 µm)
  • resolution: starting with 0,5 cm-1
  • accessories: ATR crystal Ge

UV-VIS-NIR spectrometer Cary 5000 (Varian)

UV-VIS-NIR spectrometer Cary 5000 (Varian)
© Fraunhofer IWS Dresden

UV-VIS-NIR spectrometer Cary 5000 (Varian)

The UV-VIS-NIR –spectrometer is able to monitor transmission and specula reflection spectra within the ultra violet to the near infra-red range. This technique testifies the transmission of optical coatings on glasses or the reflection of reflective surfaces. Furthermore it determines the characteristics of carbon nano tubes. In addition it is possible to determine the photocatalytical activity by measuring the reduction of methylene blue according to DIN 52980.

Requirements

  • sample size: transmission 15 x 15 mm2 to 150 x 150 mm2, specular reflection 15 x 15 mm2 to 40 x 40 mm2, height max. 2 mm
  • photocatalytical test: sample size  20 x 20 mm2 to 30 x 30 mm2, height max. 2 mm

UV-VIS-NIR spectrometer Cary 5000 (Varian)

  • measuring mode: transmission, specular reflection
  • measuring range: 200 nm - 2500 nm
  • resolution: starting with 1 nm
  • accessories: specular reflection angle of incidence  20° - 70°, optical cables

UV-VIS spectrometer MCS 400 (Zeiss)

UV-VIS spectrometer „MCS 400“ (Zeiss)
© Fraunhofer IWS Dresden

UV-VIS spectrometer „MCS 400“ (Zeiss)

The UV-VIS spectrometer (200 nm - 1000 nm) delivers information about the material electronic structure and is very suitable to detect strip edges of semi conductors or filters or to determine surface colors by measuring the specular reflection, the diffuse reflection or the transmission.

Requirements

  • sample size: starting with 5 x 5 mm2

UV-VIS spectrometer MCS 400 (Zeiss)

  • flexible, portable diode cell spectrometer with optical cables
  • measuring range: 200 nm - 1000 nm
  • resolution: ~ 1 nm
  • accessoires: specular reflection angle of incidence  0° resp. 45°, integrating sphere to measure the diffuse reflection

Spectrometer IFS66 (Bruker)

Lab spectrometer "IFS66" (Bruker)
© Fraunhofer IWS Dresden

Lab spectrometer "IFS66" (Bruker)

  • frequency range: 400 - 12500 cm-1
  • measuring mode: Transmission, Emission
  • resolution: bis zu 0,5 cm-1
  • accessories: optical fiber (cm‑1), 8 m long path cell

Spectrometer Process-FTIR „Matrix“ (Bruker)

Process-FTIR spectrometer "Matrix" (Bruker)
© Fraunhofer IWS Dresden

Process-FTIR spectrometer "Matrix" (Bruker)

  • frequency range: 400 - 5000 cm-1
  • measuring mode: transmission, emission
  • resolution: up to 0,5 cm-1
  • accessories: flexible glass cells, reflection set-up

Raman microscope Renishaw 3000 (Renishaw)

Raman microscope "Renishaw 3000" (Renishaw)
© Fraunhofer IWS Dresden

Raman microscope "Renishaw 3000" (Renishaw)

Complementarily to the IP spectroscopic technique the Raman spectroscopy informs about bonding relations within the material and about molecule and networking structures. Raman spectroscopy units the spectroscopic advantages within the visible spectral range (high lateral resolution, high sensitivity) with that of the infra-red spectroscopic technique (sensitivity of the structure). The non-contact and non-destructive measuring procedure, in which a laser excites lattice and molecular vibrations, can be applied to very much different materials (ceramics, glasses, plastics, semi-conductors, silicon and carbon.

Service offer

  • Raman spectroscopic structure analysis of customer-tailored samples (among others, carbon nano tubes CNTs, amorphous carbon a-C, diamond-like carbon DLC, amorphous silicon a-Si, silicon carbide SiC, titanium dioxide TiO2, …)
  • line scans and 2D-mapping
  • detection of temperature dependant structure and phase transformations up to temperatures of 1200°C even with inert gas

Requirements

  • sample size up to appr. 10 x 10 cm2, height max. 1,5 cm
  • measuring through optically transparent material (packaging, glass windows)
  • even suitable for aqueous solution

Raman microscope Renishaw 3000 (Renishaw)

  • measuring range: 200 cm-1 - 4000 cm-1
  • excitation: 514 nm (at the sample appr. 3,5 mW/µm2) or 785 nm (at the sample appr. 85 mW/µm2) – filters can reduce the performance to 50%, 25%, 10%, 1%
  • lateral resolution: 1 µm (= a magnification of 100, further magnifications: 10x, 20x, 50x)
  • accessoires: XY cross table for mapping procedures, hot stage up to 1200°C