Producer / type

• JEM-2100; company JEOL
  

Equipment / technical data

• 200 kV accelerating voltage
• 4 level condenser system for flexible beam control
• high resolution analytical pole shoe: resolution: 0.14 nm; sample tilt +/- 30 °
• modern multi scan camera systems
• wide angle camera for fast live image, overview and diffraction images
• high resolution camera with outstanding image quality
• scanning feature (STEM)
• EDX analytical system (JED2300T)

Methods

• conventional transmission electron microscopy
• high resolution transmission electron microscopy (HRTEM)
• electron diffraction
• selected area diffraction (SAD)
• nano beam diffraction (NBD)
• scanning transmission electron microscopy (STEM)
• bright field and high angle annular dark field imaging (HAADF)
• energy dispersive X-ray spectroscopy (EDX)
• point analysis, line scan, mapping, sequential analysis, drift correction